发明名称 |
METHOD FOR MANUFACTURING Ge-Cr ALLOY SPUTTERING TARGET |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a Ge-Cr alloy sputtering target and a method of manufacturing it, which prevent unevenness in film forming speed of a GeCrN series layer film-formed by reactive sputtering as an intermediate layer between a recording layer and a protection layer of a phase change optical disk and in the film composition and can increase product yields. <P>SOLUTION: The Ge-Cr alloy sputtering target containing 5-50 at.% of Cr is characterized by having a relative density of 95% or higher. The method for manufacturing the Ge-Cr alloy sputtering target is characterized by uniformly dispersing and mixing a Cr powder of 75 μm or less size after flat sieving and a Ge powder of 250 μm or less size after sieving, the Ge powder having a BET specific surface area of 0.4 m<SP>2</SP>/g or less, and sintering the mixture. <P>COPYRIGHT: (C)2009,JPO&INPIT |
申请公布号 |
JP2009187651(A) |
申请公布日期 |
2009.08.20 |
申请号 |
JP20090016239 |
申请日期 |
2009.01.28 |
申请人 |
NIPPON MINING & METALS CO LTD |
发明人 |
TAKAMI HIDEO;YASUJIMA HIROHISA |
分类号 |
G11B7/26;B22F1/00;C22C1/04;C22C28/00;C23C14/34;G11B7/24;G11B7/254;G11B7/257 |
主分类号 |
G11B7/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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