发明名称 THERMAL INFRARED DETECTION ELEMENT
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a thermal type infrared detection element which restrains negative return effect by wiring resistance and has high sensitivity. <P>SOLUTION: This thermal infrared detection elements includes a diode 101, a power source Vdd which supplies a constant supply voltage to the positive electrode of the diode through first wiring, a voltage setting circuit 106 which sets up the voltage applied to both ends of the diode, and a current reading circuit 108 which is connected to the negative electrode of the diode through second wiring and the voltage setting circuit and reads the current of the diode. The voltage setting circuit 106 controls the voltage Vref of a connecting point 105 of the second wiring and the voltage setting circuit to a voltage subtracted by a voltage drop generated by the resistance 102 of the first wiring, the resistance 103 of the second wiring, and a current If of the diode. <P>COPYRIGHT: (C)2009,JPO&INPIT</p>
申请公布号 JP2009186457(A) 申请公布日期 2009.08.20
申请号 JP20080284425 申请日期 2008.11.05
申请人 MITSUBISHI ELECTRIC CORP 发明人 ONAKADO TAKAHIRO;UENO MASAFUMI
分类号 G01J1/42;G01J1/44;H01L27/14;H04N5/33 主分类号 G01J1/42
代理机构 代理人
主权项
地址