发明名称 FINFET WITH SEPARATE GATES AND METHOD FOR FABRICATING A FINFET WITH SEPARATE GATES
摘要 <p>The present invention relates to a FinFET with separate gates and to a method for fabricating the same. A dielectric gate-separation layer between first and second gate electrodes has an extension in a direction pointing from a first to a second gate layer that is smaller than a lateral extension of the fin between its opposite lateral faces. This structure corresponds with a processing method that starts from a covered basic FinFET structure with a continuous first gate layer, and proceeds to remove parts of the first gate layer and of a first gate-isolation layer through a contact opening to the gate layer. Subsequently, a replacement gate-isolation layer that at the same time forms the gate separation layer fabricated, followed by filling the tunnel with a replacement gate layer and a metal filling.</p>
申请公布号 WO2009101564(A1) 申请公布日期 2009.08.20
申请号 WO2009IB50506 申请日期 2009.02.09
申请人 NXP B.V.;SONSKY, JAN;SURDEANU, RADU 发明人 SONSKY, JAN;SURDEANU, RADU
分类号 H01L21/336;H01L29/78 主分类号 H01L21/336
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