发明名称 APPARATUS FOR MEASUREMENT OF COMPLEX CAPACITANCE
摘要 An apparatus for measurement of a complex capacitance is provided to measure accurate complex electric capacitance through the principles of a dual source bridge. A bridge circuit is composed of a resistor, a DC power source, and high accuracy galvanometer(10). A resistor to be measured is connected between a second node(b) and a third node(c), and a first fix resistor(R1) and a second fixed resistor(R2) are ratio arm, and a variable resistor(R3) is a standard arm. In the dual source bridge, a first power source, a second power source, a first resistor, and a second resistor are connected in series.
申请公布号 KR20090088493(A) 申请公布日期 2009.08.20
申请号 KR20080013787 申请日期 2008.02.15
申请人 KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE 发明人 KIM, KYU TAE;SONG, WOON;KIM, MUN SEOG;CHONG, YON UK;KIM, WAN SEOP
分类号 G01R27/26 主分类号 G01R27/26
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