摘要 |
An apparatus for measurement of a complex capacitance is provided to measure accurate complex electric capacitance through the principles of a dual source bridge. A bridge circuit is composed of a resistor, a DC power source, and high accuracy galvanometer(10). A resistor to be measured is connected between a second node(b) and a third node(c), and a first fix resistor(R1) and a second fixed resistor(R2) are ratio arm, and a variable resistor(R3) is a standard arm. In the dual source bridge, a first power source, a second power source, a first resistor, and a second resistor are connected in series. |
申请人 |
KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE |
发明人 |
KIM, KYU TAE;SONG, WOON;KIM, MUN SEOG;CHONG, YON UK;KIM, WAN SEOP |