发明名称 |
APPARATUS AND METHOD FOR PLASMA TREATMENT |
摘要 |
A plasma processing apparatus and a plasma processing method are provided to improve a plasma processing state of a substrate by optimizing a supply method of a cooling gas and an apply method of a voltage applied to an electrode pattern of an electrostatic chuck. A power source is applied to an electrostatic chuck(60) in which a substrate(S) is loaded. A cooling gas is supplied between the substrate and the electrostatic chuck. Plasma is formed inside a process chamber(10). In case a supply amount of the cooling gas exceeds a predetermined value, a plasma process is stopped. In case a value detected in a voltage sensor(50) deviates from an error tolerance of the predetermined value, the plasma process is stopped. A set value of a supply amount of the cooling gas is 10sccm.
|
申请公布号 |
KR20090088752(A) |
申请公布日期 |
2009.08.20 |
申请号 |
KR20080014207 |
申请日期 |
2008.02.15 |
申请人 |
ADP ENGINEERING CO., LTD. |
发明人 |
HA, SU CHUL;PARK, WOO JONG;SONG, HO KEUN |
分类号 |
H01L21/205 |
主分类号 |
H01L21/205 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|