发明名称 APPARATUS AND METHOD FOR PLASMA TREATMENT
摘要 A plasma processing apparatus and a plasma processing method are provided to improve a plasma processing state of a substrate by optimizing a supply method of a cooling gas and an apply method of a voltage applied to an electrode pattern of an electrostatic chuck. A power source is applied to an electrostatic chuck(60) in which a substrate(S) is loaded. A cooling gas is supplied between the substrate and the electrostatic chuck. Plasma is formed inside a process chamber(10). In case a supply amount of the cooling gas exceeds a predetermined value, a plasma process is stopped. In case a value detected in a voltage sensor(50) deviates from an error tolerance of the predetermined value, the plasma process is stopped. A set value of a supply amount of the cooling gas is 10sccm.
申请公布号 KR20090088752(A) 申请公布日期 2009.08.20
申请号 KR20080014207 申请日期 2008.02.15
申请人 ADP ENGINEERING CO., LTD. 发明人 HA, SU CHUL;PARK, WOO JONG;SONG, HO KEUN
分类号 H01L21/205 主分类号 H01L21/205
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