发明名称 METHOD FOR PRESORTING OF CMOS CHIPS MADE ON SILICON-ON-INSULATOR STRUCTURES, BY RESISTANCE TO RADIATION EFFECT
摘要 FIELD: physics. ^ SUBSTANCE: invention is related to the field of electronic engineering, in particular is intended for presorting of CMOS chips made on silicon-on-insulator structures by radiation resistance. CMOS chips made on silicon-on-insulator structures are radiated in stages with low dose. As criteria parametre that defines radiation resistance of chips, static consumption current is selected. In order to restore initial parametres of chips, they are additionally radiated with grounded terminals. ^ EFFECT: reduction of time for chips restoration, performance of presorting by single parametre, determination of actual resistance of every specific chip to dose effect of ionising radiation. ^ 1 dwg
申请公布号 RU2364880(C1) 申请公布日期 2009.08.20
申请号 RU20070146805 申请日期 2007.12.17
申请人 FEDERAL'NOE GOSUDARSTVENNOE UNITARNOE PREDPRIJATIE FEDERAL'NYJ NAUCHNO-PROIZVODSTVENNYJ TSENTR "NAUCHNO-ISSLEDOVATEL'SKIJ INSTITUT IZMERITEL'NYKH SISTEM IM. JU.E. SEDAKOVA" 发明人 SEDAKOV ANDREJ JULIEVICH;JASHANIN IGOR' BORISOVICH;SKOBELEV ALEKSEJ VLADIMIROVICH;SOGOJAN ARMEN VAGOEVICH;DAVYDOV GEORGIJ GEORGIEVICH;NIKIFOROV ALEKSANDR JUR'EVICH;TELETS VITALIJ ARSEN'EVICH
分类号 G01R31/26 主分类号 G01R31/26
代理机构 代理人
主权项
地址