| 摘要 |
A probe card is provided to control the height of the mount tip based on data of the field in case the poor contact is generated. The probe card comprises the frame(110), the probe mounting bar(200), the printed circuit board(120), the stiffener(140), a planarization controlling unit(300). The frame is installed at the lower part of a plurality of probes. And the probe mounting bar is positioned in the lower part of frame. The printed circuit board is positioned on the frame to which the probe which is installed. The planarization controlling unit is distributed on the stiffener. The stiffener is positioned on the printed circuit board.
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