发明名称 METHOD OF MANUFACTURING GROUP III NITRIDE CRYSTAL
摘要 A manufacturing method of a III family nitride crystal is provided to restrict generation of a crack of the III family nitride crystal when a III family nitride substrate is removed efficiently. A manufacturing method of a III family nitride crystal includes the following steps of: growing a III family nitride crystal having different one between kind and rate of constitutional atoms and the kinds and concentration of dopant on a main surface of a III family nitride substrate(10); and removing the III family nitride substrate with vapor phase etching; and spinning etching gas on the other surface of the III family nitride substrate. The spinning etching uses one kind at least selected from a group consisting of HCI gas, Cl2 gas and H2 gas. The difference of the etching temperature of the spinning etching and the growth temperature of the III family nitride crystal is 200‹C or less.
申请公布号 KR20090088307(A) 申请公布日期 2009.08.19
申请号 KR20090004621 申请日期 2009.01.20
申请人 SUMITOMO ELECTRIC INDUSTRIES, LTD. 发明人 SATO FUMITAKA;NAKAHATA SEIJI
分类号 C01B21/06 主分类号 C01B21/06
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