发明名称 |
METHOD FOR DETECTING HIGH IMPEDANCE FAULTS BY ANALYZING A LOCAL DEVIATION FROM A REGULARIZATION |
摘要 |
A method for detecting high impedance faults, including: receiving an input waveform from a circuit; computing a root mean square of the input waveform; fitting a regression line to the root mean squares; computing a deviation between the regression line and the root mean squares; determining whether the deviations are above a threshold; and outputting a value indicating that a fault has occurred in the circuit when the deviation is above the threshold and outputting a value indicating that a fault did not occur in the circuit when the deviation is below the threshold.
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申请公布号 |
US2009204347(A1) |
申请公布日期 |
2009.08.13 |
申请号 |
US20080028466 |
申请日期 |
2008.02.08 |
申请人 |
NOWICKI TOMASZ J;SWIRSZCZ GRZEGORZ M |
发明人 |
NOWICKI TOMASZ J.;SWIRSZCZ GRZEGORZ M. |
分类号 |
G06F17/18;G01R31/02 |
主分类号 |
G06F17/18 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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