发明名称 METHOD FOR DETECTING HIGH IMPEDANCE FAULTS BY ANALYZING A LOCAL DEVIATION FROM A REGULARIZATION
摘要 A method for detecting high impedance faults, including: receiving an input waveform from a circuit; computing a root mean square of the input waveform; fitting a regression line to the root mean squares; computing a deviation between the regression line and the root mean squares; determining whether the deviations are above a threshold; and outputting a value indicating that a fault has occurred in the circuit when the deviation is above the threshold and outputting a value indicating that a fault did not occur in the circuit when the deviation is below the threshold.
申请公布号 US2009204347(A1) 申请公布日期 2009.08.13
申请号 US20080028466 申请日期 2008.02.08
申请人 NOWICKI TOMASZ J;SWIRSZCZ GRZEGORZ M 发明人 NOWICKI TOMASZ J.;SWIRSZCZ GRZEGORZ M.
分类号 G06F17/18;G01R31/02 主分类号 G06F17/18
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