发明名称 FABRICATION OF ATOMIC SCALE DEVICES
摘要 This invention concerns the fabrication of nano to atomic scale devices, that is electronic devices fabricated down to atomic accuracy. The fabrication process uses either an SEM or a STM tip to pattern regions on a semiconductor substrate. Then, forming electrically active parts of the device at those regions. Encapsulating the formed device. Using a SEM or optical microscope to align locations for electrically conducting elements on the surface of the encapsulating semiconductor with respective active parts of the device encapsulated below the surface. Forming electrically conducting elements on the surface at the aligned locations. And, electrically connecting electrically conducting elements on the surface with aligned parts of the device encapsulated below the surface to allow electrical connectivity and tunability of the device. In further aspects the invention concerns the devices themselves.
申请公布号 WO2009097643(A1) 申请公布日期 2009.08.13
申请号 WO2008AU01814 申请日期 2008.12.09
申请人 QUCOR PTY LTD;SIMMONS, MICHELLE, YVONNE;FUHRER, ANDREAS;FUECHSLE, MARTIN;WEBER, BENT;REUSCH, THILO, CURD, GERHARD;POK, WILSON;RUESS, FRANK 发明人 SIMMONS, MICHELLE, YVONNE;FUHRER, ANDREAS;FUECHSLE, MARTIN;WEBER, BENT;REUSCH, THILO, CURD, GERHARD;POK, WILSON;RUESS, FRANK
分类号 B82B3/00;B82B1/00;H01L21/28;H01L21/31 主分类号 B82B3/00
代理机构 代理人
主权项
地址
您可能感兴趣的专利