| 摘要 |
PROBLEM TO BE SOLVED: To provide a quality evaluation device for performing more properly quality evaluation of an object. SOLUTION: This device includes a void detection part 12 for detecting each void V in an evaluation object, a cluster part 13 for classifying the voids V into a cluster Cn based on a distance between each adjacent void V, and a quality evaluation part 14 for performing quality evaluation of the evaluation object based on the size of the cluster Cn. Accordingly, the device detects the voids V in the evaluation object, classify the voids V into the cluster Cn based on the distance between each adjacent void V, and evaluate the quality of the evaluation object based on the size of the classified cluster Cn. Since the size of the classified cluster Cn shows the degree of concentrical existence of the voids V, proper quality evaluation is performed even in the case of an object having the same void fraction. COPYRIGHT: (C)2009,JPO&INPIT
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