| 摘要 |
<p>Disclosed is a plated structure having extremely high conductivity. Specifically disclosed is a plated structure having a palladium plating layer formed on the surface of a metal base. In the palladium plating layer, the crystal orientation rate of the (111) plane as measured by X-ray diffraction is 45-60%, and the total of the crystal orientation rate of the (200) plane and the crystal orientation rate of the (220) plane is 40-55%.</p> |
