发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To prevent characteristics of an electronic circuit including a pair of circuit elements forming a pair from deteriorating owing to mechanical stress of a bump electrode and wiring. SOLUTION: The pair of circuit elements forming a pair of differential amplifiers 210 are disposed in a region on a semiconductor chip 500 except for a region where wiring lines 202 to 205 are formed (including a region where bump electrodes BP3 to BP6 are formed) at a logic part 200. Consequently, mechanical stress due to the wiring lines 202 to 205 and bump electrodes BP3 to BP6 is not applied to those circuit elements. Accordingly, balance of electric characteristics of the pair of circuit elements forming the pair are prevented from being lost owing to the mechanical stress and, in other words, pair characteristics of the pair of circuit elements forming the pair can be improved. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009182304(A) 申请公布日期 2009.08.13
申请号 JP20080022756 申请日期 2008.02.01
申请人 SANYO ELECTRIC CO LTD;SANYO SEMICONDUCTOR CO LTD 发明人 AMATATSU YOSHIMASA;TAKINO SEIJI
分类号 H01L21/822;H01L21/60;H01L21/82;H01L27/04 主分类号 H01L21/822
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