PROBE NEEDLE AND MANUFACTURING METHOD OF THE SAME

摘要

Disclosed is a probe needle with a bent tip used for a probe card and a method that hinders a decline in the yield of the probe needle due to fracture originating in the depression in the processed surface that is caused during the bending process of the tip of the probe needle, by ensuring that the direction of the groove created when machining the tip of the probe needle to be at an angle of 45°or less or roughly parallel to the longitudinal direction of a metal wire.