发明名称 ELECTROCHEMICAL SENSING AND DATA ANALYSIS SYSTEM, APPARATUS AND METHOD FOR METAL PLATING
摘要 An electrochemical sensing and data analysis system (and apparatus and methods) adapted for control of electroplating of various metal(s) on a wafer or other suitable substrate. Components of the system utilize multi-variate analysis (MVA) and galvanostatic, potentiodynamic or other electrical measurements (or combinations thereof) to predict, adjust or control plating parameters, e.g., to achieve improved yield of plated substrates with acceptable levels of defects (or lack thereof).
申请公布号 US2009200171(A1) 申请公布日期 2009.08.13
申请号 US20070305650 申请日期 2007.06.18
申请人 ADVANCED TECHNOLOGY MATERIALS, INC. 发明人 HAN JIANWEN;HILGARTH MONICA K.;KING MACKENZIE;LURCOTT STEVEN M.
分类号 C25D21/12;C25D17/00 主分类号 C25D21/12
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