| 摘要 |
The invention relates to a microscope that enables a phase object or surface pits and projections to be observed at a relatively low image-formation magnification of 4 or lower over a wide viewing range yet in a relatively narrow spatial frequency distribution range. The microscope comprises a light source 2, an illumination optical system 3 for guiding light from the light source 2 to an object 4 under observation, a partial aperture located substantially at the pupil position 28 of the illumination optical system 3 and an image-formation optical system 15, 16, 18 for forming on the image-formation plane 19 an image 4 of the object under observation illuminated by light passing through the partial aperture, and further comprises an eyepiece optical system 6 or an image pickup optical system for viewing the image formed on the image-formation plane 19. The diameter of the image of said partial aperture at the pupil position 30 of the image-formation optical system is set smaller than the pupil diameter of the image-formation optical system, and at the pupil position 30 of the image-formation optical system there is located wavefront introduction means for introducing in the pupil position 30 of the image-formation optical system a wavefront varying in size with the pupil diameter.
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