发明名称 |
WIRING LINE CONTACT STRUCTURE, AND MANUFACTURING METHOD THEREOF |
摘要 |
PROBLEM TO BE SOLVED: To provide a wiring line contact structure which is formed with a low resistance material while having a low resistance contact characteristic, to provide a manufacturing method thereof, to provide a thin film transistor substrate including the wiring line contact structure of an excellent contact characteristic, and to provide a manufacturing method thereof. SOLUTION: The wiring line contact structure forming method includes: a process of forming a wiring line having an opening on a substrate; a process of laminating an insulating film covering the wiring line; a process of patterning the insulating film to form a contact hole exposing the opening; and a process of forming a first conductive layer in contact with the wiring line through the contact hole on the insulating film. COPYRIGHT: (C)2009,JPO&INPIT |
申请公布号 |
JP2009182343(A) |
申请公布日期 |
2009.08.13 |
申请号 |
JP20090114497 |
申请日期 |
2009.05.11 |
申请人 |
SAMSUNG ELECTRONICS CO LTD |
发明人 |
LIM SEUNG-TAEK;HONG MUN-PYO;ROH NAM-SEOK;SONG YOUNG-JOO;KWAK SANG-KI;CHOI KWON-YOUNG;SONG KEUN-KYU |
分类号 |
G02F1/1343;H01L21/768;G02F1/1345;G02F1/136;G02F1/1362;G02F1/1368;H01L21/336;H01L21/77;H01L21/84;H01L23/522;H01L23/532;H01L27/12;H01L29/417;H01L29/423;H01L29/49;H01L29/786 |
主分类号 |
G02F1/1343 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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