发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device which allows a shallow n-type impurity diffusion region to be formed on a germanium layer. SOLUTION: The semiconductor device includes a p-type semiconductor mainly made of a germanium, a pair of n-type impurity diffusion regions selectively formed on the surface of the p-type semiconductor, a gate insulating layer formed on the p-type semiconductor disposed between the pair of n-type impurity diffusion regions, and a gate electrode formed on the gate insulating layer. At least part of the n-type impurity diffusion regions contains either a silicon or a carbon that is selected as an additive element from the silicon and carbon. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009182109(A) 申请公布日期 2009.08.13
申请号 JP20080019073 申请日期 2008.01.30
申请人 TOSHIBA CORP 发明人 TATSUMURA KOSUKE;KOIKE MASAHIRO;NAKASAKI YASUSHI;KOYAMA MASATO;KAMATA YOSHIKI
分类号 H01L29/78;H01L21/265;H01L21/28;H01L29/417;H01L29/423;H01L29/49 主分类号 H01L29/78
代理机构 代理人
主权项
地址