发明名称 INSPECTION METHOD AND INSPECTION SYSTEM OF INFORMATION CARRIER
摘要 <P>PROBLEM TO BE SOLVED: To surely discriminate a defective product through inspection of an information carrier and to avoid an adverse effect of defective product transportation in an inspection method and an inspection system of an information carrier for performing product inspection in a manufacturing process of an information carrier such as an IC tag, an IC label, an IC card and a magnetic card. <P>SOLUTION: The system discriminates a non-defective product and a defective product through information reading by setting, as an object to be inspected, an IC tag 22 as an information carrier in which information is carried and communication is freely made in a non-contact manner for reading the information, and attaching a bad mark 23 by means of conductive paste disabling communication of the IC tag 22A discriminated as the defective product through inspection to block information reading, so as to cover an IC chip of the IC tag 22A. <P>COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009181245(A) 申请公布日期 2009.08.13
申请号 JP20080018364 申请日期 2008.01.29
申请人 TOPPAN FORMS CO LTD 发明人 KIMURA TOSHIBUMI;ENDO YASUYUKI;MATSUYAMA KAZUMASA
分类号 G06K19/077;G06K19/06;G06K19/07 主分类号 G06K19/077
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