发明名称 METHOD AND PROGRAM FOR PREPARING EVALUATION PATTERN
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a method and program for preparing an evaluation pattern, which can appropriately evaluate pattern transfer fidelity. <P>SOLUTION: The method for preparing a pattern includes: a step of inspecting the pattern transfer fidelity of an object to be inspected for each peripheral candidate pattern, wherein a plurality of the marginal candidate patterns are arranged on a periphery of the object to be inspected; a step of extracting at least one peripheral pattern from among the plurality of the marginal candidate patterns based on the inspection results; and a step of preparing the evaluation pattern by arranging the peripheral patterns on the periphery of the object to be evaluated. <P>COPYRIGHT: (C)2009,JPO&INPIT</p>
申请公布号 JP2009181053(A) 申请公布日期 2009.08.13
申请号 JP20080021558 申请日期 2008.01.31
申请人 TOSHIBA CORP 发明人 MAEDA YUKITO;OGAWA RYUJI;KYO SUIGEN;TANAKA SATOSHI
分类号 G03F1/36;G03F1/68 主分类号 G03F1/36
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