发明名称 SEMICONDUCTOR DEVICE MANUFACTURING METHOD
摘要 <p>A semiconductor device having a VIA hole without disconnection caused by step is achieved. A semiconductor device and its manufacturing method, the semiconductor device comprising: a semi-insulating substrate 11 in which an electrode (12) is formed on a surface (11a) of one side and in which an aperture (11c) passed through from the surface 11a of one side to a surface (11b) of another side is formed; and a conductive layer (17) formed in an inner surface of the aperture (11c), and electrically connected with the electrode (12); wherein the aperture (11c) has a tapered region (11d) where an inside diameter of a part located in the surface (11b) of another side is larger than an inside diameter of a part located in the surface (11a) of one side.</p>
申请公布号 EP2088619(A1) 申请公布日期 2009.08.12
申请号 EP20070832621 申请日期 2007.11.28
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 ONODERA, KEN;TAKAGI, KAZUTAKA
分类号 H01L21/3065;H01L21/308;H01L21/768 主分类号 H01L21/3065
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