发明名称 Transient suppression semiconductor device
摘要 The HBT-based transient suppression device contains a collector layer of a first conduction type, a base layer of a second conduction type, an emitter layer of the first conduction type, stacked in this order sequentially on a top side of a heavily doped substrate of the first conduction type. The doping concentration of the base layer is higher than that of the emitter and collector layers, and that the thickness of the collector layer is less than 300 nm, so that the BVCEO breakdown voltage is reduced below 5V Additionally, the thickness of the base layer is larger than the sum of the thickness of a section of the emitter-base depletion region extending into the base layer and the thickness of a section of the base-collector depletion region extending into the base layer, so that the base layer is not operated in a punch-through condition.
申请公布号 US7573080(B1) 申请公布日期 2009.08.11
申请号 US20080143738 申请日期 2008.06.20
申请人 VISUAL PHOTONICS EPITAXY CO., LTD. 发明人 HUANG CHAO-HSING;CHIN YU-CHUNG
分类号 H01L29/739;H01L23/62 主分类号 H01L29/739
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