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发明名称
Probe card layout
摘要
Multi-touchdown, parallel test probe cards having probe elements arranged to provide greater than 99% efficiency during testing of a substrate having a plurality of die thereon, and methods of use.
申请公布号
US7573276(B2)
申请公布日期
2009.08.11
申请号
US20060592425
申请日期
2006.11.03
申请人
MICRON TECHNOLOGY, INC.
发明人
CALDWELL JOHN
分类号
G01R31/02
主分类号
G01R31/02
代理机构
代理人
主权项
地址
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