发明名称 |
MODIFICATION OF PB-FREE SOLDER ALLOY COMPOSITIONS TO IMPROVE INTERLAYER DIELECTRIC DELAMINATION IN SILICON DEVICES AND ELECTROMIGRATION RESISTANCE IN SOLDER JOINTS |
摘要 |
A solder joint comprising a solder capture pad on a substrate having a circuit; and a lead free solder selected from the group comprising Sn-Ag-Cu solder and Sn-Ag solder adhered to the solder capture pad; the solder selected from the group comprising between 0.1 to 2.0% by weight Sb or Bi, and 0.5 to 3.0% Ag. Formation of voids at an interface between the solder and the solder capture pad is suppressed, by including Zn. Interlayer dielectric delamination is suppressed, and electromigration characteristics are greatly improved. Methods for forming solder joints using the solders.
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申请公布号 |
US2009197114(A1) |
申请公布日期 |
2009.08.06 |
申请号 |
US20080254790 |
申请日期 |
2008.10.20 |
申请人 |
SHIH DA-YUAN;HENDERSON DONALD W;KANG SUNG K;LU MINHUA;NAH JAE-WOONG;SRIVASTAVA KAMALESH |
发明人 |
SHIH DA-YUAN;HENDERSON DONALD W.;KANG SUNG K.;LU MINHUA;NAH JAE-WOONG;SRIVASTAVA KAMALESH |
分类号 |
B32B15/01;B23K1/20 |
主分类号 |
B32B15/01 |
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