发明名称 RESIST COMPOSITION FOR LIQUID IMMERSION LITHOGRAPHY, RESIST PATTERN FORMING METHOD AND FLUORINE-CONTAINING COPOLYMER
摘要 <P>PROBLEM TO BE SOLVED: To provide: a new fluorine-containing copolymer useful as an additive for a resist composition for liquid immersion lithography; a resist composition for liquid immersion lithography containing the same; and a resist pattern forming method. <P>SOLUTION: The resist composition for liquid immersion lithography includes a base component (A) of which the solubility in an alkali developer changes by the action of an acid, an acid generator component (B) which generates an acid upon exposure to light, and the fluorine-containing copolymer (C) having a constitutional unit represented by general formula (c1-1). <P>COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009175363(A) 申请公布日期 2009.08.06
申请号 JP20080013024 申请日期 2008.01.23
申请人 TOKYO OHKA KOGYO CO LTD 发明人 FURUYA SANAE;DAZAI NAOHIRO;MORI YOSHITAKA;SHIONO HIROHISA;HIRANO TOMOYUKI
分类号 G03F7/039;C08F8/12;C08F8/24;C08F212/14;C08F220/24;G03F7/004;H01L21/027 主分类号 G03F7/039
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