发明名称 |
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device having a structure capable of not only suppressing a punch-through current but also reusing a silicon wafer for pasting in manufacturing the semiconductor device using an SOI technique; and to provide its manufacturing method. SOLUTION: A channel region is formed using a laminate of semiconductor films obtained by: injecting impurities 109, 112 of conductivity type opposite to that of source region and drain region into a semiconductor film 107 pasted to a substrate 106 separated from a silicon wafer 101; and joining a single crystal semiconductor film 114 thereonto. COPYRIGHT: (C)2009,JPO&INPIT
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申请公布号 |
JP2009177147(A) |
申请公布日期 |
2009.08.06 |
申请号 |
JP20080321935 |
申请日期 |
2008.12.18 |
申请人 |
SEMICONDUCTOR ENERGY LAB CO LTD |
发明人 |
KATO SHO;ISAKA FUMITO;KAKEHATA TETSUYA;GOTO HIROMITSU;SHIMOMURA AKIHISA |
分类号 |
H01L29/786;G02F1/1368;H01L21/02;H01L21/20;H01L21/265;H01L21/336;H01L27/12;H01L51/50 |
主分类号 |
H01L29/786 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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