发明名称 SYSTEM AND PROCESS FOR ULTRASONIC CHARACTERIZATION OF DEFORMED STRUCTURES
摘要 Generally speaking, the method of the present invention is performed by making various ultrasonic scans at preselected orientations along the length of a material being tested. Data from the scans are then plotted together with various calculated parameters that are calculated from this data. Lines or curves are then fitted to the respective plotted points. Review of these plotted curves allows the location and severity of defects within these sections to be determined and quantified. With this information various other decisions related to how, when or whether repair or replacement of a particular portion of a structure can be made.
申请公布号 US2009193899(A1) 申请公布日期 2009.08.06
申请号 US20090392845 申请日期 2009.02.25
申请人 BATTELLE MEMORIAL INSTITUTE 发明人 PANETTA PAUL D.;MORRA MARINO;JOHNSON KENNETH I.
分类号 G01N29/07 主分类号 G01N29/07
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