发明名称 |
METHOD FOR MANUFACTURING GaN-BASED SEMICONDUCTOR DEVICE |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a method for manufacturing a GaN-based semiconductor device which is capable of lowering its operation voltage while making productivity improvements and reducing manufacturing costs by manufacturing a p-type GaN-based semiconductor without performing additional heat treatment process after the lamination process a semiconductor layer is completed. <P>SOLUTION: As the uppermost layer of a lamination structure of a GaN-based semiconductor to be formed on a substrate, a p-type contact layer composed of AlGaN is formed by a MOVPE method, and then the falling temperature of the p-type contact layer is carried out while ammonia and an inert gas with respect to the GaN semiconductor are introduced into a growing furnace so that the ratio of ammonia becomes 0 to 0.025. <P>COPYRIGHT: (C)2009,JPO&INPIT |
申请公布号 |
JP2009177219(A) |
申请公布日期 |
2009.08.06 |
申请号 |
JP20090118944 |
申请日期 |
2009.05.15 |
申请人 |
MITSUBISHI CHEMICALS CORP |
发明人 |
KUDO HIROMITSU;YAMADA TOMOO;TADATOMO KAZUYUKI;OUCHI YOICHIRO;OKAGAWA HIROAKI |
分类号 |
H01L33/06;H01L33/12;H01L33/32 |
主分类号 |
H01L33/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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