发明名称 |
METHOD, SYSTEM, AND COMPUTER PROGRAM PRODUCT FOR IMPROVED ELECTRICAL ANALYSIS |
摘要 |
An improved method, system, user interface, and computer program product is described for using a memory and learning component to improve capacitance and resistance estimates based on the types of layouts and devices being evaluated. According to some approaches, a learning component is implemented that uses recommended test sets from the evaluation component to automatically test the extraction estimates against the field solver. Variability models from manufacturing or electrical analysis may also be used to select a series of objects (unique conductor geometries) that make up a conduction path or net or specific conductor geometries for evaluation and additional learning improvement.
|
申请公布号 |
US2009199139(A1) |
申请公布日期 |
2009.08.06 |
申请号 |
US20080344327 |
申请日期 |
2008.12.26 |
申请人 |
WHITE DAVID;LIBERTY MATTHEW;NEQUIST ERIC;MCSHERRY MICHAEL |
发明人 |
WHITE DAVID;LIBERTY MATTHEW;NEQUIST ERIC;MCSHERRY MICHAEL |
分类号 |
G06F17/50 |
主分类号 |
G06F17/50 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|