GRINDER FOR PREPARING TRANSMISSION ELECTRON MICROSCOPE SPECIMENS

摘要

A grinder for preparing transmission electron microscope specimens is provided to make quickly thin specimens of the electronic material or the ceramic material. The grinder for preparing transmission electron microscope specimens comprises the polishing pad, and the specimen fixing means(10) and moving tool. The specimen fixing means is arranged on the polishing pad. The movable mean moves the specimen fixing means on the polishing pad. The specimen fixing means has the specimen support(11), the support stand holder(14), and the gauge holder(16) and the gauge(18). The specimen support unit extends to the longitudinal direction. The specimen support unit has the fixing unit and protrusion(13). The fixing unit is arranged in the bottom side of the specimen support unit in order to fix the specimen. The protrusion portion is arranged in the upper side of the specimen support. The support stand holder is fixed to the moving tool through one side of the peripheral part. The support stand holder has a hollow. The gauge holder has the opening and the hollow on the bottom side in order to accommodate the specimen support. The gauge holder has the assessing pipe(17) on the upper side in order to screw the gauge. The gauge contacts the probe part of the assessing pipe to the protrusion of the specimen support.