发明名称 INSPECTION DEVICE AND INSPECTION PROGRAM FOR ELECTRONIC COMPONENT
摘要 PROBLEM TO BE SOLVED: To provide an inspection device and an inspection program for electronic components, capable of responding to high-mix, low-volume production of electronic components facilitating in editing of inspection contents. SOLUTION: The inspection device inspects electronic components, based on an inspection condition information, corresponding to inspection specification information indicating the category of the specification. On editing the inspection condition information displayed in a table form, in the inspection condition view display column 204 in the cell editing screen 200 displayed on an LCD, firstly a cell operation button 205 is clicked, to move to the cell editing mode. Next, the cell to be changed is double-clicked, to move into a condition capable of receiving an input, and a new number is input to each cell by operating the keyboard, and is edited and stored in a hard disc device by clicking the "store in database" button 205c. The inspection is performed, based on this edited inspection condition information. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009174977(A) 申请公布日期 2009.08.06
申请号 JP20080013322 申请日期 2008.01.24
申请人 PANASONIC CORP 发明人 DAIHO MASUMI
分类号 G01R31/28 主分类号 G01R31/28
代理机构 代理人
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