发明名称 |
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a method of manufacturing a semiconductor device which is not limited by the concentration of a diffusion layer and of which junction leak current is reduced enough. SOLUTION: The method of manufacturing a semiconductor device includes: a step to dope an area of first conductivity type of a silicon substrate with impurities of second conductivity type opposite to first conductivity type and heat it so as to form a diffusion layer of the second conductivity type; and a step to implant nitride or fluorine ions to the diffusion layer and give a carbon dioxide gas laser to the diffusion layer. COPYRIGHT: (C)2009,JPO&INPIT
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申请公布号 |
JP2009176808(A) |
申请公布日期 |
2009.08.06 |
申请号 |
JP20080011387 |
申请日期 |
2008.01.22 |
申请人 |
ELPIDA MEMORY INC;HITACHI LTD |
发明人 |
OYU SHIZUNORI;OKONOGI KENSUKE;SHIMA AKIO |
分类号 |
H01L21/265;H01L29/78 |
主分类号 |
H01L21/265 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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