发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method of manufacturing a semiconductor device which is not limited by the concentration of a diffusion layer and of which junction leak current is reduced enough. SOLUTION: The method of manufacturing a semiconductor device includes: a step to dope an area of first conductivity type of a silicon substrate with impurities of second conductivity type opposite to first conductivity type and heat it so as to form a diffusion layer of the second conductivity type; and a step to implant nitride or fluorine ions to the diffusion layer and give a carbon dioxide gas laser to the diffusion layer. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009176808(A) 申请公布日期 2009.08.06
申请号 JP20080011387 申请日期 2008.01.22
申请人 ELPIDA MEMORY INC;HITACHI LTD 发明人 OYU SHIZUNORI;OKONOGI KENSUKE;SHIMA AKIO
分类号 H01L21/265;H01L29/78 主分类号 H01L21/265
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