| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide an access method by which the number of input pins of a memory can be decreased in order to reduce electrical wiring density of a memory module, and to save test costs of a memory chip. <P>SOLUTION: A method for accessing a memory chip comprises: a step in which a plurality of first input pins and a plurality of second input pins are provided at the memory chip; a step in which a plurality of row address signals are input respectively to the first input pins; and a step in which a plurality of column address signals are input respectively to the second input pins. Row address command package length of the respective row address signals corresponds to a plurality of clock periods of a clock signal. Column address command package length of the respective column address signals corresponds to a plurality of clock periods of the clock signal. <P>COPYRIGHT: (C)2009,JPO&INPIT |
