| 摘要 |
A semiconductor distance measuring element is provided with a semiconductor region (1), a light receiving surface embedded region (11a), a first charge storing region (12a), a first charge read region (13), a first potential control means (31), a second potential control means (32), a first discharge drain region (14), and a third potential control means (33). A signal charge dependent on a delay time of reflection light in a first repetition cycle is repeatedly transferred from the light receiving surface embedded region (11a) so as to be stored in the first charge storing region (12a) as a first signal charge. All the signal charges generated by reflection light in a second repetition cycle are repeatedly transferred from the light receiving surface embedded region (11a) and are stored in the first charge storing region (12a) as second signal charges. Then, the ratio of the total quantities of the first and the second signal charges is obtained and a distance to an object is measured. ® KIPO & WIPO 2009
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