发明名称 HIGH-FREQUENCY CHARACTERISTIC MEASURING INSTRUMENT
摘要 PROBLEM TO BE SOLVED: To provide a high-frequency characteristic measuring instrument which enables measurement of high accuracy, without having to use a waveguide pipe that has a special shape, even when the orientation characteristics of a sample are measured by making a sampling region small, by enhancement in the frequency of the measurement frequency in order to enhance measurement accuracy. SOLUTION: In the high-frequency characteristic measuring instrument utilizing a microwave cavity resonator, opening plates, respectively having openings different in size are arranged on the sides of the microwave introducing part and microwave detection part in the waveguide pipe. The shape of the openings is circular, when the dimension of the short side of the rectangular cross section of the waveguide pipe is (a); and the diameter of the larger opening is (c), where c/a is (c/a)<0.7. When the diameter of the smaller opening is (b), c/b is (c/b)<5. Furthermore, formulae (b/a)>0.1 and (b+c)/a>0.4 hold. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009174929(A) 申请公布日期 2009.08.06
申请号 JP20080012102 申请日期 2008.01.23
申请人 OJI PAPER CO LTD 发明人 FURUKAWA IKUKO;NAGATA SHINICHI
分类号 G01N22/00 主分类号 G01N22/00
代理机构 代理人
主权项
地址