发明名称 METHOD OF FORMING A GATE STACK STRUCTURE
摘要 A method of forming an integrated circuit structure on a substrate, the substrate includes a primary region and a secondary region. A first layer of a first material of a first thickness is formed over the substrate. A portion of the first layer is removed over the primary region to expose the substrate. The structure is exposed to an oxidizing medium. This forms a second layer, for example, of an oxide material primary region of the substrate. The second layer has a second thickness. Additionally, at least a portion of said first layer is converted to a third layer, for example, of an oxynitride material. The third layer has a third thickness.
申请公布号 US2009197387(A1) 申请公布日期 2009.08.06
申请号 US20080025789 申请日期 2008.02.05
申请人 CHARTERED SEMICONDUCTOR MANUFACTURING, LTD. 发明人 WONG WILL;CHAN LAP;LEK ALAN
分类号 H01L21/283;H01L21/77 主分类号 H01L21/283
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