发明名称 ION TRAP MASS SPECTROMETER
摘要 <p>After various ions are trapped in an ion trap (1), a wide-band voltage having a notch with a predetermined frequency width is applied between end cap electrodes (12, 13) to remove ions having relatively large differences of mass from that of the target ions in a short time. After this removal, the target ions and ions having masses near the mass of the target ions are left in the ion trap (1). Unwanted ions of each species not removed in the previous processing are treated as target ions and removed by applying a sinusoidal wave voltage corresponding to each species between the end cap electrodes (12, 13). Thus, only the target ions are finally left in the ion trap (1). By cleaving, product ions are produced and subjected to mass spectroscopy. In such a way, the target ions can be quickly selected with high accuracy and resolution.</p>
申请公布号 WO2009095948(A1) 申请公布日期 2009.08.06
申请号 WO2008JP00098 申请日期 2008.01.28
申请人 SHIMADZU CORPORATION;YAMAGUCHI, SHINICHI 发明人 YAMAGUCHI, SHINICHI
分类号 H01J49/42;G01N27/62 主分类号 H01J49/42
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