发明名称 WIPE SAMPLING ASSEMBLY
摘要 <p>A wipe sampling assembly for ion mobility spectrometer inspection is composed of three layers. The upper and lower layers are a first protecting sheet (21) and a second protecting sheet (22) respectively, and the middle layer is a sampling sheet (11).</p>
申请公布号 WO2009094834(A1) 申请公布日期 2009.08.06
申请号 WO2008CN02057 申请日期 2008.12.24
申请人 NUCTECH COMPANY LIMITED;PENG, HUA;LIU, JIANHUA;ZHANG, YANGTIAN;ZHANG, ZHONGXIA;CHEN, WEI 发明人 PENG, HUA;LIU, JIANHUA;ZHANG, YANGTIAN;ZHANG, ZHONGXIA;CHEN, WEI
分类号 G01N1/02 主分类号 G01N1/02
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