发明名称 SUBSTRATE PLASMA PROCESSING APPARATUS AND PLASMA PROCESSING METHOD
摘要 A plasma processing apparatus and a plasma processing method of substrate are provided to control the ion radical energy with the narrow energy band by increasing the radical species density which is appropriate for the processing of the circuit board. A chamber(21) maintains the vacuum condition inside a chamber. The first electrode(22) maintains the substrate processed on the major surface. A counter electrode(23) is arranged to face with the first electrode. The first feed port applies the high frequency power having 50MHz or the higher predetermined frequency to the first electrode. The second feed port applies the DC negative pulse to the first electrode. A controller(30) controls the turn on or the off of the first feed port at the predetermined timing.
申请公布号 KR20090084694(A) 申请公布日期 2009.08.05
申请号 KR20090006307 申请日期 2009.01.23
申请人 KABUSHIKI KAISHA TOSHIBA;TOKYO ELECTRON LIMITED 发明人 AKIO UI;NAOKI TAMAOKI;TAKASHI ICHIKAWA;HISATAKA HAYASHI;TAKESHI KAMINATSUI;SHINJI HIMORI;NORIKAZU YAMADA;TAKESHI OHSE;JUN ABE
分类号 H01L21/3065;H01L21/205;H01L21/265 主分类号 H01L21/3065
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