发明名称 Probe straightness measuring method
摘要 <p>A probe straightness measuring method includes: placing a measurement jig (71) having a measurement reference surface (72) with a known profile error on a stage surface (2A) of an XY stage (2) so that the measurement reference surface (72) is slanted in a moving direction of the XY stage (2); measuring a displaced position of the measurement piece by a displacement detector of the probe each time the XY stage is moved for a predetermined distance while controlling a driving actuator so that the measurement piece (14) of a probe touches the measurement reference surface at a constant pressure; and calculating a straightness error of a measurement-piece moving mechanism on a basis of a measured position (Zreal) of the measurement piece obtained in the measuring, a nominal position (Znom) of the measurement piece obtained by a calculation and a slant angle (¸) of the measurement reference surface.</p>
申请公布号 EP2085739(A1) 申请公布日期 2009.08.05
申请号 EP20090151922 申请日期 2009.02.03
申请人 MITUTOYO CORPORATION 发明人 NEMOTO, KENTARO;YAMAGATA, MASAOKI
分类号 G01B5/012;G01B21/04 主分类号 G01B5/012
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