发明名称 |
Probe straightness measuring method |
摘要 |
<p>A probe straightness measuring method includes: placing a measurement jig (71) having a measurement reference surface (72) with a known profile error on a stage surface (2A) of an XY stage (2) so that the measurement reference surface (72) is slanted in a moving direction of the XY stage (2); measuring a displaced position of the measurement piece by a displacement detector of the probe each time the XY stage is moved for a predetermined distance while controlling a driving actuator so that the measurement piece (14) of a probe touches the measurement reference surface at a constant pressure; and calculating a straightness error of a measurement-piece moving mechanism on a basis of a measured position (Zreal) of the measurement piece obtained in the measuring, a nominal position (Znom) of the measurement piece obtained by a calculation and a slant angle (¸) of the measurement reference surface.</p> |
申请公布号 |
EP2085739(A1) |
申请公布日期 |
2009.08.05 |
申请号 |
EP20090151922 |
申请日期 |
2009.02.03 |
申请人 |
MITUTOYO CORPORATION |
发明人 |
NEMOTO, KENTARO;YAMAGATA, MASAOKI |
分类号 |
G01B5/012;G01B21/04 |
主分类号 |
G01B5/012 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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