发明名称 OXIDE SEMICONDUCTOR TRANSISTOR AND METHOD OF MANUFACTURING THE SAME
摘要 <p>An oxide semiconductor transistor and a manufacturing method thereof are provided to increase the driving current by forming gates at the upper and lower parts of channel layer. A channel layer(116) is made of an oxide semiconductor. The first gate insulating layer(110) is formed between the channel layer and the first gate(112). The second gate insulating layer(120) is formed between the channel layer and the second gate(122). The first gate insulating layer and the second gate insulating layer are made of the different material. The first gate insulating layer is made of the material not including the oxygen. The second gate insulating layer is made of the material including the oxygen.</p>
申请公布号 KR20090084642(A) 申请公布日期 2009.08.05
申请号 KR20080099608 申请日期 2008.10.10
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 SON, KYUNG SEOK;KIM, TAE SANG;KWON, JANG YEON;JUNG, JI SIM;LEE, SANG YOON;RYU, MYUNG KWAN;PARK, KYUNG BAE;YOO, BYUNG WOOK
分类号 H01L29/786;H01L21/336;H01L29/78 主分类号 H01L29/786
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