发明名称 Multilayer minus filter and fluorescence microscope
摘要 A multilayer minus filter for reflecting a light having a predetermined wavelength and transmitting a light having a wavelength longer than and shorter than the predetermined wavelength, includes a repetition layer such that a sum of an average value of optical thickness of a high refractive index layer and an average value of optical thickness of a low refractive index layer is substantially equal to a reflection wavelength lambda0 with respect to a vertically incident light, wherein, when a rate H/L between the optical thickness H of the high reflective index layer and the optical thickness L of the low reflective index layer in the repetition layer of the high refractive index layer and the low refractive index layer is larger than 0.5 and smaller than 2, a reflection band formed in the reflection wavelength lambda0 by the repetition layer is utilized.
申请公布号 US7570428(B2) 申请公布日期 2009.08.04
申请号 US20050174628 申请日期 2005.07.06
申请人 OLYMPUS CORPORATION 发明人 WATANABE TADASHI
分类号 G02B1/10 主分类号 G02B1/10
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