发明名称 Transistor having tensile strained channel and system including same
摘要 A transistor structure and a system including the transistor structure. The transistor structure comprises: a substrate including a first layer comprising a first crystalline material; a tensile strained channel formed on a surface of the first layer and comprising a second crystalline material having a lattice spacing that is smaller than a lattice spacing of the first crystalline material; a metal gate on the substrate; a pair of sidewall spacers on opposite sides of the metal gate; and a source region and a drain region on opposite sides of the metal gate adjacent a corresponding one of the sidewall spacers.
申请公布号 US7569869(B2) 申请公布日期 2009.08.04
申请号 US20070729564 申请日期 2007.03.29
申请人 INTEL CORPORATION 发明人 JIN BEEN-YIH;CHAU ROBERT S.;DATTA SUMAN;KAVALIEROS JACK T.;RADOSAVLIEVIC MARKO
分类号 H01L29/737;H01L29/778 主分类号 H01L29/737
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