发明名称 MARK EXTENSION FOR ANALYSIS OF LONG RECORD LENGTH DATA
摘要 A method of analysis of long record length data using mark duration includes displaying together with a portion of the long record length data each mark that identifies a specified feature of interest together with the mark duration. Associated with the mark may be text identifying the feature of interest, measurement values associated with the duration of the mark, or a combination thereof. Multiple sets of marks may be generated for the long record length data, which sets may be combined to generate new marks with duration. The marks also may be filtered to further refine the marks to be displayed according to user specified criteria. In this way analysis of long record length data representing an acquired signal may be readily automated so a user may move from one interesting event to another without having to pan through the long record length data.
申请公布号 US2009192740(A1) 申请公布日期 2009.07.30
申请号 US20080019833 申请日期 2008.01.25
申请人 TEKTRONIX, INC. 发明人 RULE KEITH D.;FREEMAN THOMAS L.;TAYLOR DANIEL E.;MARGESON TIMOTHY D.;KETTERER SCOTT R.
分类号 G01R13/02 主分类号 G01R13/02
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