发明名称 AUTOMATIC ANALYSIS APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide an automatic analysis apparatus capable of simplifying a comparison of a measured value of each analytical system to reduce a time required for seeking after a cause of an abnormality of the analytical system by supporting presumption of the cause. SOLUTION: The automatic analysis apparatus focuses on analytical system elements which constitutes analytical systems such as a reagent numbers list 204, a reagent dispensation list 205, an analyte dispensation list 206, performs data processing on the measured value for each analytical system element used for an analyte analysis, sorts them out to list as a measured results list 203 or visualizes changes with time of the measured value in a reaction progress graph 214. Such listing and changes with time plotted in the graph allows a user of the analysis apparatus to observe a deviation or variation of the measured value attributable to a specific analytical system element and an data alarm 212 given to the measured value, and easily discriminate the abnormality of the analytical system element, which is affecting the measured value. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009168729(A) 申请公布日期 2009.07.30
申请号 JP20080009280 申请日期 2008.01.18
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 ASANO HIROKO;YAMANO AKIHIRO
分类号 G01N35/00 主分类号 G01N35/00
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