发明名称 PROCESS OF PRODUCING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a process of producing a semiconductor device capable of processing stepwise the end part of a plurality of laminated layers while reducing the number of times of lithography. SOLUTION: A multilayered wiring layer MWL is formed with a plurality of conductive films and a plurality of insulating films laminated alternately. A multilayered mask film MLM is formed with a plurality of organic films and a plurality of insulating films laminated alternately on the multilayered wiring layer. The insulating film 8 of the uppermost layer and the conductive film 7 of the underlayer are removed out of the multilayered wiring layer using a multilayered mask film. The organic films 11, 9 of the multilayered mask film are slimmed in a direction orthogonal to its film thickness direction. A plurality of the insulating films 8, 6 of the multilayered wiring layer are etched with the slimmed organic film and the etched conductive film of the uppermost layer used as a mask. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009170661(A) 申请公布日期 2009.07.30
申请号 JP20080007185 申请日期 2008.01.16
申请人 TOSHIBA CORP 发明人 YAHASHI KATSUNORI;OMURA MITSUHIRO
分类号 H01L21/8247;H01L27/115;H01L29/788;H01L29/792 主分类号 H01L21/8247
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