| 摘要 |
<p>Disclosed is a testing apparatus for testing a device to be tested. The testing apparatus is provided with a signal supply section which supplies the device to be tested with a test signal through a transmission path, and a comparison judging section, which receives a response signal from the device to be tested, through the transmission path shared with the supply section, and judges conformity of the device, based on the comparison results obtained by comparison between a reference level, which corresponds to the logic pattern of the test signal, and a signal level of the response signal.</p> |
