Measuring probe i.e. cantilever, providing method for examining sample in e.g. atomic force microscope, involves processing measuring probe before or after measurement, where measuring probe is held at carrier device

摘要

The method involves forming a measuring probe (1) i.e. cantilever, with a probe base (1a) and a probe extension (2). The measuring probe is processed before or after a measurement and is held at a carrier device, while a section of the probe extension is separated along a given dividing line. The separated section of the probe extension is provided with a light-optical separating cut and a mechanical separating cut. A section, loaded with a probe substance, is separated as the section of the probe extension. An independent claim is also included for an arrangement comprising a probe microscope for examining of a sample.