| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device in which an electrical resistance of a memory element can be accurately measured and increase in layout area is prevented. SOLUTION: The semiconductor device 101 includes: a storage element S having a first terminal and second terminal; a current line BL which is connected to the first terminal of the storage element S; a first driver BLDV2 which is connected to the current line BL to feed a writing current to the current line BL for writing data into the storage element S; a first pad PD1 for providing a voltage; a second pad PD2 for providing a voltage; and a third pad PD3 for providing a voltage. The first driver PD1 and third pad PD3 are connected to the first driver BLDV2 while the second pad PD2 is connected to the second terminal of the storage element S. COPYRIGHT: (C)2009,JPO&INPIT
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