发明名称 METHOD OF FILLING A TRENCH AND METHOD OF FORMING AN ISOLATING LAYER STRUCTURE USING THE SAME
摘要 A method of filling a trench in a substrate ensures that a void or seam is not left in the material occupying the trench. First, a preliminary insulating layer is formed so as to extend contiguously along the bottom and sides of the trench and along an upper surface of the substrate. Impurities are then implanted into a portion of the preliminary insulating layer adjacent the top of the first trench to form a first insulating layer having a doped region and an undoped region. The doped region is removed to form a first insulating layer pattern at the bottom and sides of the first trench, and which first insulating layer pattern defines a second trench. The second trench is then filled with insulating material.
申请公布号 US2009191687(A1) 申请公布日期 2009.07.30
申请号 US20080339125 申请日期 2008.12.19
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 HONG EUNKEE;BYUN KYUNG-MUN;CHOI JONG-WAN;BAEK EUN-KYUNG;KIM YOUNG-SUN
分类号 H01L21/76 主分类号 H01L21/76
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